%0 Conference Paper %1 thomann2023reliable %A Thomann, Simon %A Mema, Albi %A Ni, Kai %A Amrouch, Hussam %B 2023 IEEE International Reliability Physics Symposium (IRPS) %D 2023 %I IEEE %K mult ubs_10005 ubs_20007 ubs_20008 ubs_30085 ubs_30182 ubs_40307 ubs_40416 unibibliografie wos %R 10.1109/IRPS48203.2023.10117810 %T Reliable FeFET-based Neuromorphic Computing through Joint Modeling of Cycle-to-Cycle Variability, Device-to-Device Variability, and Domain Stochasticity %@ 978-1-6654-5672-2 and 978-1-6654-5673-9

@inproceedings{thomann2023reliable, added-at = {2023-11-30T17:21:50.000+0100}, affiliation = {Amrouch, H (Corresponding Author), Univ Stuttgart, Chair Semicond Test \& Reliabil, Stuttgart, Germany. Thomann, Simon; Mema, Albi; Amrouch, Hussam, Univ Stuttgart, Chair Semicond Test \& Reliabil, Stuttgart, Germany. Ni, Kai, Rochester Inst Technol, Dept Microelect Engn, Rochester, NY 14623 USA.}, author = {Thomann, Simon and Mema, Albi and Ni, Kai and Amrouch, Hussam}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2fa82d9aed9f7b0c7e1922861de5dd4cc/unibiblio}, booktitle = {2023 IEEE International Reliability Physics Symposium (IRPS)}, doi = {10.1109/IRPS48203.2023.10117810}, eventdate = {2023-03-26/2023-03-30}, eventtitle = {2023 IEEE International Reliability Physics Symposium (IRPS)}, interhash = {6f2245057a8f1ed87259daf35b744967}, intrahash = {fa82d9aed9f7b0c7e1922861de5dd4cc}, isbn = {{978-1-6654-5672-2} and {978-1-6654-5673-9}}, keywords = {mult ubs_10005 ubs_20007 ubs_20008 ubs_30085 ubs_30182 ubs_40307 ubs_40416 unibibliografie wos}, language = {eng}, publisher = {IEEE}, research-areas = {Engineering; Physics}, timestamp = {2023-11-30T17:21:50.000+0100}, title = {Reliable FeFET-based Neuromorphic Computing through Joint Modeling of Cycle-to-Cycle Variability, Device-to-Device Variability, and Domain Stochasticity}, unique-id = {WOS:001007431500057}, venue = {Monterey, USA}, year = 2023 }