%0 Conference Paper %1 munozbaron2021characterization %A Muñoz Barón, Kevin %A Sharma, Kanuj %A Nitzsche, Maximilian %A Kallfass, Ingmar %B 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) %C Piscataway %D 2021 %I IEEE %K mult ubs_10005 ubs_20007 ubs_30072 ubs_30076 ubs_40346 unibibliografie wos %P 316-321 %R 10.1109/WiPDA49284.2021.9645118 %T Characterization of Electrical Parameters for Health Monitoring in SiC MOSFETs during AC Power Cycling %@ 978-1-6654-0182-1 and 978-1-6654-0183-8

@inproceedings{munozbaron2021characterization, added-at = {2022-12-14T11:17:33.000+0100}, address = {Piscataway}, affiliation = {Baron, KM (Corresponding Author), Univ Stuttgart, Inst Robust Power Semicond Syst, Stuttgart, Germany. Baron, Kevin Munoz; Sharma, Kanuj; Kallfass, Ingmar, Univ Stuttgart, Inst Robust Power Semicond Syst, Stuttgart, Germany. Nitzsche, Maximilian, Univ Stuttgart, Inst Power Elect & Elect Drives, Stuttgart, Germany.}, author = {Muñoz Barón, Kevin and Sharma, Kanuj and Nitzsche, Maximilian and Kallfass, Ingmar}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2eff5efec29a06730032ca119cc33ec99/unibiblio}, booktitle = {2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA)}, doi = {10.1109/WiPDA49284.2021.9645118}, eventdate = {2021-11-07/2021-11-11}, eventtitle = {2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA)}, interhash = {0bfefa10223150bd5871415f8553a906}, intrahash = {eff5efec29a06730032ca119cc33ec99}, isbn = {{978-1-6654-0182-1} and {978-1-6654-0183-8}}, keywords = {mult ubs_10005 ubs_20007 ubs_30072 ubs_30076 ubs_40346 unibibliografie wos}, language = {eng}, pages = {316-321}, publisher = {IEEE}, research-areas = {Engineering}, timestamp = {2022-12-14T10:17:33.000+0100}, title = {Characterization of Electrical Parameters for Health Monitoring in SiC MOSFETs during AC Power Cycling}, unique-id = {WOS:000787172500060}, venue = {Online}, year = 2021 }