Two broadband very low-noise amplifiers operating in the frequency
range from 4 to 12 GHz at cryogenic temperature are presented. The
amplifier circuits have been developed using a 100 nm gate length
InAlAs/InGaAs metamorphic high electron mobility transistor (mHEMT)
technology. The three-stage amplifiers are monolithic microwave integrated
circuit (MMIC) chips manufactured in coplanar technology. At cryogenic
temperature the first MMIC amplifier achieved a linear gain of 22
dB and an average noise temperature of 11.6 K with a power dissipation
of 41 mW. The second MMIC amplifier, with external input matching
network, exhibited a gain of 26 dB, and an excellent average noise
temperature of 8.1 K with a power dissipation of 12 mW. Both LNA
units demonstrate broad bandwidth, high gain, low noise temperature,
and compact chip size. The results obtained prove that mHEMT technology
is suitable for applications in large instantaneous bandwidth cryogenic
receivers for radio astronomy applications.
%0 Journal Article
%1 Aja_MWCL2011
%A Aja, B.
%A Schuster, K.
%A Schafer, F.
%A Gallego, J.D.
%A Chartier, S.
%A Seelmann-Eggebert, M.
%A Kallfass, I.
%A Leuther, A.
%A Massler, H.
%A Schlechtweg, M.
%A Diez, C.
%A Lopez-Fernandez, I.
%A Lenz, S.
%A Turk, S.
%D 2011
%J Microwave and Wireless Components Letters, IEEE
%K 100 11.6 12 22 26 4 41 8.1 GHz GHz;gain InAlAs-InGaAs;MMIC K;III-V K;temperature MMIC amplifiers; amplifiers;aluminium amplifiers;coplanar amplifiers;cryogenic arsenide;high chips;amplifier circuit;power circuits;broadband compounds;cryogenic compounds;low dB;gain dB;metamorphic electron electronics;gallium high integrated low-noise mHEMT-based mW;power mW;size microwave mobility nm;temperature noise semiconductors;MMIC technology;cryogenic temperature;frequency to transistor;monolithic transistors;indium very
%N 11
%P 613--615
%R 10.1109/LMWC.2011.2167502
%T Cryogenic Low-Noise mHEMT-Based MMIC Amplifiers for 4 - 12 GHz Band
%V 21
%X Two broadband very low-noise amplifiers operating in the frequency
range from 4 to 12 GHz at cryogenic temperature are presented. The
amplifier circuits have been developed using a 100 nm gate length
InAlAs/InGaAs metamorphic high electron mobility transistor (mHEMT)
technology. The three-stage amplifiers are monolithic microwave integrated
circuit (MMIC) chips manufactured in coplanar technology. At cryogenic
temperature the first MMIC amplifier achieved a linear gain of 22
dB and an average noise temperature of 11.6 K with a power dissipation
of 41 mW. The second MMIC amplifier, with external input matching
network, exhibited a gain of 26 dB, and an excellent average noise
temperature of 8.1 K with a power dissipation of 12 mW. Both LNA
units demonstrate broad bandwidth, high gain, low noise temperature,
and compact chip size. The results obtained prove that mHEMT technology
is suitable for applications in large instantaneous bandwidth cryogenic
receivers for radio astronomy applications.
@article{Aja_MWCL2011,
abstract = {Two broadband very low-noise amplifiers operating in the frequency
range from 4 to 12 GHz at cryogenic temperature are presented. The
amplifier circuits have been developed using a 100 nm gate length
InAlAs/InGaAs metamorphic high electron mobility transistor (mHEMT)
technology. The three-stage amplifiers are monolithic microwave integrated
circuit (MMIC) chips manufactured in coplanar technology. At cryogenic
temperature the first MMIC amplifier achieved a linear gain of 22
dB and an average noise temperature of 11.6 K with a power dissipation
of 41 mW. The second MMIC amplifier, with external input matching
network, exhibited a gain of 26 dB, and an excellent average noise
temperature of 8.1 K with a power dissipation of 12 mW. Both LNA
units demonstrate broad bandwidth, high gain, low noise temperature,
and compact chip size. The results obtained prove that mHEMT technology
is suitable for applications in large instantaneous bandwidth cryogenic
receivers for radio astronomy applications.},
added-at = {2020-09-07T14:26:58.000+0200},
author = {Aja, B. and Schuster, K. and Schafer, F. and Gallego, J.D. and Chartier, S. and Seelmann-Eggebert, M. and Kallfass, I. and Leuther, A. and Massler, H. and Schlechtweg, M. and Diez, C. and Lopez-Fernandez, I. and Lenz, S. and Turk, S.},
bdsk-url-1 = {https://doi.org/10.1109/LMWC.2011.2167502},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2bf7860ecdeed35f13e6c47c5a8403b7d/ingmarkallfass},
doi = {10.1109/LMWC.2011.2167502},
interhash = {dd996286c9610901c392927609f9ef2c},
intrahash = {bf7860ecdeed35f13e6c47c5a8403b7d},
issn = {1531-1309},
journal = {Microwave and Wireless Components Letters, IEEE},
keywords = {100 11.6 12 22 26 4 41 8.1 GHz GHz;gain InAlAs-InGaAs;MMIC K;III-V K;temperature MMIC amplifiers; amplifiers;aluminium amplifiers;coplanar amplifiers;cryogenic arsenide;high chips;amplifier circuit;power circuits;broadband compounds;cryogenic compounds;low dB;gain dB;metamorphic electron electronics;gallium high integrated low-noise mHEMT-based mW;power mW;size microwave mobility nm;temperature noise semiconductors;MMIC technology;cryogenic temperature;frequency to transistor;monolithic transistors;indium very},
number = 11,
pages = {613--615},
timestamp = {2025-05-26T10:46:15.000+0200},
title = {{Cryogenic Low-Noise mHEMT-Based MMIC Amplifiers for 4 - 12 GHz Band}},
volume = 21,
year = 2011
}