%0 Conference Paper %1 klemme2023upheaving %A Klemme, Florian %A Salamin, Sami %A Amrouch, Hussam %B 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) %D 2023 %I IEEE %K %T Upheaving Self-Heating Effects from Transistor to Circuit Level using Conventional EDA Tool Flows %@ 979-8-3503-9624-9

@inproceedings{klemme2023upheaving, added-at = {2024-01-16T10:34:19.000+0100}, affiliation = {Klemme, F (Corresponding Author), Univ Stuttgart, Stuttgart, Germany. Klemme, Florian; Amrouch, Hussam, Univ Stuttgart, Stuttgart, Germany. Salamin, Sami, Hyperstone Co, Constance, Germany.}, author = {Klemme, Florian and Salamin, Sami and Amrouch, Hussam}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2f257fd52a381877945e02e34194ab7e9/unibiblio}, booktitle = {2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)}, eventdate = {2023-04-17/2023-04-19}, eventtitle = {2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)}, interhash = {29838da367f7d283d638bdee02a30120}, intrahash = {f257fd52a381877945e02e34194ab7e9}, isbn = {979-8-3503-9624-9}, keywords = {}, language = {eng}, publisher = {IEEE}, research-areas = {Automation \& Control Systems; Computer Science; Engineering}, timestamp = {2024-01-16T09:34:19.000+0100}, title = {Upheaving Self-Heating Effects from Transistor to Circuit Level using Conventional EDA Tool Flows}, unique-id = {WOS:001027444200200}, venue = {Antwerp, Belgium}, year = 2023 }