%0 Journal Article %1 kumar2023crosslayer %A Kumar, Shubham %A Chatterjee, Swetaki %A Thomann, Simon %A Chauhan, Yogesh Singh %A Amrouch, Hussam %D 2023 %I IEEE %J IEEE transactions on circuits and systems. 1, Fundamental theory and applications %K ubs_10005 ubs_20008 ubs_30085 ubs_40416 unibibliografie wos %N 7 %P 2891-2903 %R 10.1109/TCSI.2023.3265427 %T Cross-Layer Reliability Modeling of Dual-Port FeFET : Device-Algorithm Interaction %V 70

@article{kumar2023crosslayer, added-at = {2023-12-21T15:02:44.000+0100}, affiliation = {Kumar, S (Corresponding Author), Univ Stuttgart, Chair Semicond Test & Reliabil STAR, D-70569 Stuttgart, Germany. Kumar, Shubham; Chatterjee, Swetaki; Thomann, Simon; Amrouch, Hussam, Univ Stuttgart, Chair Semicond Test & Reliabil STAR, D-70569 Stuttgart, Germany. Kumar, Shubham, Indian Inst Technol Kanpur, Kanpur 208016, India. Chauhan, Yogesh Singh, Indian Inst Technol Kanpur, Dept Elect Engn, Kanpur 208016, India. Amrouch, Hussam, Tech Univ Munich TUM, Chair AI Processor Design, D-80333 Munich, Germany.}, author = {Kumar, Shubham and Chatterjee, Swetaki and Thomann, Simon and Chauhan, Yogesh Singh and Amrouch, Hussam}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/288c879253850e9a57b332374c67c0ffc/unibiblio}, doi = {10.1109/TCSI.2023.3265427}, interhash = {fc83be58f2f34af3e18d3af474e1031b}, intrahash = {88c879253850e9a57b332374c67c0ffc}, issn = {{1549-8328} and {1558-0806}}, journal = {IEEE transactions on circuits and systems. 1, Fundamental theory and applications}, keywords = {ubs_10005 ubs_20008 ubs_30085 ubs_40416 unibibliografie wos}, language = {eng}, number = 7, orcid-numbers = {Amrouch, Hussam/0000-0002-5649-3102}, pages = {2891-2903}, publisher = {IEEE}, research-areas = {Engineering}, timestamp = {2023-12-21T15:02:44.000+0100}, title = {Cross-Layer Reliability Modeling of Dual-Port FeFET : Device-Algorithm Interaction}, unique-id = {WOS:000980231200001}, volume = 70, year = 2023 }