%0 Journal Article %1 BAGETTIJERONIMO2023114869 %A Bagetti Jeronimo, Mateus %A Schindele, Jens %A Straub, Hubert %A Gromala, Przemyslaw Jakub %A Wunderle, Bernhard %A Zimmermann, André %D 2023 %J Microelectronics Reliability %K bagetti from:samethalvaci ifm_article jeronimo zimmermann %P 114869 %R https://doi.org/10.1016/j.microrel.2022.114869 %T On the influence of lid materials for flip-chip ball grid array package applications %U https://www.sciencedirect.com/science/article/pii/S0026271422004371 %V 140 %X Autonomous driving is a key vehicle capability for future mobility solutions that relies on the reliability of its high-performance vehicle computer. As for any electronics for automotive applications, thermal management is a crucial point. A very extensively employed approach for improving heat removal is the usage of heat spreaders in the form of a package lid, especially for flip-chip applications. The usage of a lid in flip-chip ball grid array (BGA) packages improves heat removal based on the heat spreading capabilities of the lid, and reduces package warpage, since with a lid the package becomes stiffer. However, adding a lid also increases stresses at solder interconnects. When selecting a material for the lid, the most intuitive criterion is to focus on the material’s thermal conductivity. Sometimes overlooked, the coefficient of thermal expansion (CTE) of the lid also plays an important role regarding package warpage and reliability of thermal interface materials (TIM) as well as solder interconnects, such as solder bumps. This work focuses on the influence of different lid materials at package level for flip-chip applications. Consequently, the influence of three alternative materials is investigated and compared to the performance of a standard copper lid. For the quantification of the effects, a validated finite element model of a flip-chip package is presented, with the thermo-mechanical performance of the studied lid materials validated based on package warpage, peel strains and plastic strain energy density at the bumps, as well as on peel and shear strains at the TIM.

@article{BAGETTIJERONIMO2023114869, abstract = {Autonomous driving is a key vehicle capability for future mobility solutions that relies on the reliability of its high-performance vehicle computer. As for any electronics for automotive applications, thermal management is a crucial point. A very extensively employed approach for improving heat removal is the usage of heat spreaders in the form of a package lid, especially for flip-chip applications. The usage of a lid in flip-chip ball grid array (BGA) packages improves heat removal based on the heat spreading capabilities of the lid, and reduces package warpage, since with a lid the package becomes stiffer. However, adding a lid also increases stresses at solder interconnects. When selecting a material for the lid, the most intuitive criterion is to focus on the material’s thermal conductivity. Sometimes overlooked, the coefficient of thermal expansion (CTE) of the lid also plays an important role regarding package warpage and reliability of thermal interface materials (TIM) as well as solder interconnects, such as solder bumps. This work focuses on the influence of different lid materials at package level for flip-chip applications. Consequently, the influence of three alternative materials is investigated and compared to the performance of a standard copper lid. For the quantification of the effects, a validated finite element model of a flip-chip package is presented, with the thermo-mechanical performance of the studied lid materials validated based on package warpage, peel strains and plastic strain energy density at the bumps, as well as on peel and shear strains at the TIM.}, added-at = {2023-06-14T13:59:32.000+0200}, author = {Bagetti Jeronimo, Mateus and Schindele, Jens and Straub, Hubert and Gromala, Przemyslaw Jakub and Wunderle, Bernhard and Zimmermann, André}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/25646a0f9c8ef7561fee334eed931d10e/ifm}, doi = {https://doi.org/10.1016/j.microrel.2022.114869}, interhash = {8200dfceacd436a69cf3a44bfead3030}, intrahash = {5646a0f9c8ef7561fee334eed931d10e}, issn = {0026-2714}, journal = {Microelectronics Reliability}, keywords = {bagetti from:samethalvaci ifm_article jeronimo zimmermann}, pages = 114869, timestamp = {2023-06-26T13:28:01.000+0200}, title = {On the influence of lid materials for flip-chip ball grid array package applications}, url = {https://www.sciencedirect.com/science/article/pii/S0026271422004371}, volume = 140, year = 2023 }