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%0 Journal Article
%1 journals/mr/CasarDPWQMA11
%A Cäsar, M.
%A Dammann, Maximilian
%A Polyakov, Vladimir
%A Waltereit, Patrick
%A Quay, Rüdiger
%A Mikulla, Michael
%A Ambacher, Oliver
%D 2011
%J Microelectronics Reliability
%K dblp
%N 2
%P 224-228
%T Critical factors influencing the voltage robustness of AlGaN/GaN HEMTs.
%U http://dblp.uni-trier.de/db/journals/mr/mr51.html#CasarDPWQMA11
%V 51
@article{journals/mr/CasarDPWQMA11,
added-at = {2019-06-30T00:00:00.000+0200},
author = {Cäsar, M. and Dammann, Maximilian and Polyakov, Vladimir and Waltereit, Patrick and Quay, Rüdiger and Mikulla, Michael and Ambacher, Oliver},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/216ec77d126df1ebe4b0b23cc61e4ab85/dblp},
ee = {https://doi.org/10.1016/j.microrel.2010.09.006},
interhash = {23136613ac252ff99d784bd32248d301},
intrahash = {16ec77d126df1ebe4b0b23cc61e4ab85},
journal = {Microelectronics Reliability},
keywords = {dblp},
number = 2,
pages = {224-228},
timestamp = {2019-09-27T10:58:15.000+0200},
title = {Critical factors influencing the voltage robustness of AlGaN/GaN HEMTs.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#CasarDPWQMA11},
volume = 51,
year = 2011
}