%0 Journal Article %1 journals/mr/CasarDPWQMA11 %A Cäsar, M. %A Dammann, Maximilian %A Polyakov, Vladimir %A Waltereit, Patrick %A Quay, Rüdiger %A Mikulla, Michael %A Ambacher, Oliver %D 2011 %J Microelectronics Reliability %K dblp %N 2 %P 224-228 %T Critical factors influencing the voltage robustness of AlGaN/GaN HEMTs. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#CasarDPWQMA11 %V 51

@article{journals/mr/CasarDPWQMA11, added-at = {2019-06-30T00:00:00.000+0200}, author = {Cäsar, M. and Dammann, Maximilian and Polyakov, Vladimir and Waltereit, Patrick and Quay, Rüdiger and Mikulla, Michael and Ambacher, Oliver}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/216ec77d126df1ebe4b0b23cc61e4ab85/dblp}, ee = {https://doi.org/10.1016/j.microrel.2010.09.006}, interhash = {23136613ac252ff99d784bd32248d301}, intrahash = {16ec77d126df1ebe4b0b23cc61e4ab85}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 2, pages = {224-228}, timestamp = {2019-09-27T10:58:15.000+0200}, title = {Critical factors influencing the voltage robustness of AlGaN/GaN HEMTs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#CasarDPWQMA11}, volume = 51, year = 2011 }