%0 Conference Paper %1 ranjbar2023learningoriented %A Ranjbar, Behnaz %A Klemme, Florian %A Genßler, Paul %A Amrouch, Hussam %A Jung, Jinhyo %A Dave, Shail %A So, Hwisoo %A Lee, Kyongwoo %A Shrivastava, Aviral %A Lin, Ji-Yung %A Weckx, Pieter %A Mishra, Subrat %A Catthoor, Francky %A Biswas, Dwaipayan %A Kumar, Akash %B 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) %D 2023 %I IEEE %K ubs_10005 ubs_20008 ubs_30085 ubs_40416 unibibliografie wos %T Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level %@ 979-8-3503-9624-9

@inproceedings{ranjbar2023learningoriented, added-at = {2024-01-16T10:34:18.000+0100}, affiliation = {Ranjbar, B (Corresponding Author), Tech Univ Dresden, CFAED, Chair Processor Design, Dresden, Germany. Ranjbar, Behnaz; Kumar, Akash, Tech Univ Dresden, CFAED, Chair Processor Design, Dresden, Germany. Klemme, Florian; Genssler, Paul R.; Amrouch, Hussam, Univ Stuttgart, Chair Semicond Test \& Reliabil STAR, Stuttgart, Germany. Jung, Jinhyo; So, Hwisoo; Lee, Kyongwoo, Yonsei Univ, Seoul, South Korea. Dave, Shail; Shrivastava, Aviral, Arizona State Univ, Sch Comp \& Augmented Intelligence, Tempe, AZ USA. Lin, Ji-Yung; Weckx, Pieter; Mishra, Subrat; Catthoor, Francky; Biswas, Dwaipayan, IMEC, Leuven, Belgium. Lin, Ji-Yung; Catthoor, Francky, Katholieke Univ Leuven, Leuven, Belgium.}, author = {Ranjbar, Behnaz and Klemme, Florian and Genßler, Paul and Amrouch, Hussam and Jung, Jinhyo and Dave, Shail and So, Hwisoo and Lee, Kyongwoo and Shrivastava, Aviral and Lin, Ji-Yung and Weckx, Pieter and Mishra, Subrat and Catthoor, Francky and Biswas, Dwaipayan and Kumar, Akash}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/223ec267fe625479550b8b99e75a3eed3/unibiblio}, booktitle = {2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)}, eventdate = {2023-04-17/2023-04-19}, eventtitle = {2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)}, interhash = {9dedc7349787c0afe398900c71cff3ce}, intrahash = {23ec267fe625479550b8b99e75a3eed3}, isbn = {979-8-3503-9624-9}, keywords = {ubs_10005 ubs_20008 ubs_30085 ubs_40416 unibibliografie wos}, language = {eng}, publisher = {IEEE}, research-areas = {Automation \& Control Systems; Computer Science; Engineering}, timestamp = {2024-01-16T10:34:18.000+0100}, title = {Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level}, unique-id = {WOS:001027444200217}, venue = {Antwerp, Belgium}, year = 2023 }