%0 Conference Paper %1 amrouch2022machine %A Amrouch, Hussam %A Chakrabarty, Krishnendu %A Pflüger, Dirk %A Polian, Ilia %A Sauer, Matthias %A Reorda, Matteo Sonza %B 2022 IEEE European Test Symposium (ETS) %C Piscataway %D 2022 %E Fransi, Sergi %E Taouil, Mottaqiallah %I IEEE %K mult ubs_10005 ubs_20008 ubs_30082 ubs_30085 ubs_40304 ubs_40349 ubs_40416 unibibliografie wos %R 10.1109/ETS54262.2022.9810416 %T Machine Learning for Test, Diagnosis, Post-Silicon Validation and Yield Optimization %@ 978-1-6654-6706-3 and 978-1-6654-6707-0

@inproceedings{amrouch2022machine, added-at = {2023-02-08T09:12:18.000+0100}, address = {Piscataway}, affiliation = {Amrouch, H (Corresponding Author), Univ Stuttgart, Stuttgart, Germany. Amrouch, Hussam; Pflueger, Dirk; Polian, Ilia, Univ Stuttgart, Stuttgart, Germany. Chakrabarty, Krishnendu, Duke Univ, Durham, NC USA. Sauer, Matthias, Advantest Europe GmbH, Boblingen, Germany. Reorda, Matteo Sonza, Politecn Torino, Turin, Italy.}, author = {Amrouch, Hussam and Chakrabarty, Krishnendu and Pflüger, Dirk and Polian, Ilia and Sauer, Matthias and Reorda, Matteo Sonza}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/203fc8480b1951b5b8ab551c9432b35df/unibiblio}, booktitle = {2022 IEEE European Test Symposium (ETS)}, doi = {10.1109/ETS54262.2022.9810416}, editor = {Fransi, Sergi and Taouil, Mottaqiallah}, eventdate = {2022-05-23/2022-05-27}, eventtitle = {2022 IEEE European Test Symposium (ETS)}, interhash = {77ccfe537aed9d8d7c34ac0ec18e2462}, intrahash = {03fc8480b1951b5b8ab551c9432b35df}, isbn = {{978-1-6654-6706-3} and {978-1-6654-6707-0}}, keywords = {mult ubs_10005 ubs_20008 ubs_30082 ubs_30085 ubs_40304 ubs_40349 ubs_40416 unibibliografie wos}, language = {eng}, publisher = {IEEE}, timestamp = {2023-09-25T15:40:30.000+0200}, title = {Machine Learning for Test, Diagnosis, Post-Silicon Validation and Yield Optimization}, unique-id = {WOS:000853268100025}, venue = {Barcelona, Spain}, year = 2022 }