%0 Conference Paper %1 santen2021reliabilitydriven %A Santen, Victor M. van %A Thomann, Simon %A Chauhan, Yogesh S. %A Henkel, Jörg %A Amrouch, Hussam %B 2021 IEEE 39th VLSI Test Symposium (VTS) %C Piscataway %D 2021 %I IEEE %K liste mult ubs_10005 ubs_20008 ubs_30085 ubs_40304 ubs_40416 unibibliografie %R 10.1109/VTS50974.2021.9441053 %T Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks %@ 978-1-6654-1949-9 and 978-1-6654-3005-0

@inproceedings{santen2021reliabilitydriven, added-at = {2022-09-09T14:52:08.000+0200}, address = {Piscataway}, author = {Santen, Victor M. van and Thomann, Simon and Chauhan, Yogesh S. and Henkel, Jörg and Amrouch, Hussam}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2030ed22e6c0e45929e996385ec4e075b/unibiblio}, booktitle = {2021 IEEE 39th VLSI Test Symposium (VTS)}, doi = {10.1109/VTS50974.2021.9441053}, eventdate = {2021-04-25/2021-04-28}, eventtitle = {2021 IEEE 39th VLSI Test Symposium (VTS)}, interhash = {0362e1dcbe9ac6bef99ee74830d7d84a}, intrahash = {030ed22e6c0e45929e996385ec4e075b}, isbn = {{978-1-6654-1949-9} and {978-1-6654-3005-0}}, keywords = {liste mult ubs_10005 ubs_20008 ubs_30085 ubs_40304 ubs_40416 unibibliografie}, language = {eng}, publisher = {IEEE}, timestamp = {2022-09-09T12:52:08.000+0200}, title = {Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks}, venue = {Online}, year = 2021 }