Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Conference Paper
%1 santen2021reliabilitydriven
%A Santen, Victor M. van
%A Thomann, Simon
%A Chauhan, Yogesh S.
%A Henkel, Jörg
%A Amrouch, Hussam
%B 2021 IEEE 39th VLSI Test Symposium (VTS)
%C Piscataway
%D 2021
%I IEEE
%K
%R 10.1109/VTS50974.2021.9441053
%T Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks
%@ 978-1-6654-1949-9 and 978-1-6654-3005-0
@inproceedings{santen2021reliabilitydriven,
added-at = {2023-08-31T15:02:46.000+0200},
address = {Piscataway},
author = {Santen, Victor M. van and Thomann, Simon and Chauhan, Yogesh S. and Henkel, Jörg and Amrouch, Hussam},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2030ed22e6c0e45929e996385ec4e075b/puma-wartung},
booktitle = {2021 IEEE 39th VLSI Test Symposium (VTS)},
doi = {10.1109/VTS50974.2021.9441053},
eventdate = {2021-04-25/2021-04-28},
eventtitle = {2021 IEEE 39th VLSI Test Symposium (VTS)},
interhash = {0362e1dcbe9ac6bef99ee74830d7d84a},
intrahash = {030ed22e6c0e45929e996385ec4e075b},
isbn = {{978-1-6654-1949-9} and {978-1-6654-3005-0}},
keywords = {},
language = {eng},
publisher = {IEEE},
timestamp = {2023-08-31T13:02:46.000+0200},
title = {Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks},
venue = {Online},
year = 2021
}