%0 Journal Article %1 journals/mr/EthertonQWWMDSZAG06 %A Etherton, M. %A Qu, Ning %A Willemen, J. %A Wilkening, Wolfgang %A Mettler, S. %A Dissegna, M. %A Stella, R. %A Zullino, L. %A Andreini, A. %A Gieser, Horst A. %D 2006 %J Microelectronics Reliability %K dblp %N 5-6 %P 666-676 %T Study of CDM specific effects for a smart power input protection structure. %U http://dblp.uni-trier.de/db/journals/mr/mr46.html#EthertonQWWMDSZAG06 %V 46

@article{journals/mr/EthertonQWWMDSZAG06, added-at = {2019-01-22T00:00:00.000+0100}, author = {Etherton, M. and Qu, Ning and Willemen, J. and Wilkening, Wolfgang and Mettler, S. and Dissegna, M. and Stella, R. and Zullino, L. and Andreini, A. and Gieser, Horst A.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/206c866918224f551acce7f4cee7e7666/dblp}, ee = {https://doi.org/10.1016/j.microrel.2005.10.008}, interhash = {f568270e2502ceee7b0d5510507ff2f3}, intrahash = {06c866918224f551acce7f4cee7e7666}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {5-6}, pages = {666-676}, timestamp = {2019-09-27T10:58:27.000+0200}, title = {Study of CDM specific effects for a smart power input protection structure.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#EthertonQWWMDSZAG06}, volume = 46, year = 2006 }