%0 Journal Article %1 Sharma_CIPS2020 %A Sharma, K. %A Muñoz Barón, K. %A Ruthardt, J. %A Hückelheim, J. %A Koch, D. %A Münzenmayer, F. %A Kallfass, I. %D 2020 %J in Proc. 11th International Conference on Integrated Power Electronics Systems, CIPS, Berlin %K imported %P 1 - 6 %T Characterization of the Junction Temperature of SiC Power Devices via Quasi-Threshold Voltage as Temperature Sensitive Electrical Parameter

@article{Sharma_CIPS2020, added-at = {2025-05-26T10:46:09.000+0200}, author = {Sharma, K. and Mu{\~{n}}oz Bar{\'{o}}n, K. and Ruthardt, J. and H{\"{u}}ckelheim, J. and Koch, D. and M{\"{u}}nzenmayer, F. and Kallfass, I.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/27d0d083e0cf7401f6f031b62a391bb4a/ingmarkallfass}, date-modified = {2023-04-07 12:29:24 +0200}, interhash = {d15434beafbdfee3eafe91330a38a03f}, intrahash = {7d0d083e0cf7401f6f031b62a391bb4a}, journal = {in Proc. 11th International Conference on Integrated Power Electronics Systems, CIPS, Berlin}, keywords = {imported}, pages = {1 - 6}, timestamp = {2025-05-26T10:46:09.000+0200}, title = {{Characterization of the Junction Temperature of SiC Power Devices via Quasi-Threshold Voltage as Temperature Sensitive Electrical Parameter}}, year = 2020 }