%0 Conference Paper %1 conf/ats/RothbartNSWRM04 %A Rothbart, Klaus %A Neffe, Ulrich %A Steger, Christian %A Weiss, Reinhold %A Rieger, Edgar %A Mühlberger, Andreas %B Asian Test Symposium %D 2004 %I IEEE Computer Society %K dblp %P 118-121 %T High Level Fault Injection for Attack Simulation in Smart Cards. %U http://dblp.uni-trier.de/db/conf/ats/ats2004.html#RothbartNSWRM04 %@ 0-7695-2235-1

@inproceedings{conf/ats/RothbartNSWRM04, added-at = {2016-01-13T00:00:00.000+0100}, author = {Rothbart, Klaus and Neffe, Ulrich and Steger, Christian and Weiss, Reinhold and Rieger, Edgar and Mühlberger, Andreas}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/250e98c42a184d26f43b4a4f708f1c9fb/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2004}, ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.2004.48}, interhash = {bfa59f0d45c1b16203ab592053d3e1fe}, intrahash = {50e98c42a184d26f43b4a4f708f1c9fb}, isbn = {0-7695-2235-1}, keywords = {dblp}, pages = {118-121}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T14:23:22.000+0100}, title = {High Level Fault Injection for Attack Simulation in Smart Cards.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2004.html#RothbartNSWRM04}, year = 2004 }