%0 Journal Article %1 journals/tvlsi/SayedBT19 %A Sayed, Nour %A Bishnoi, Rajendra %A Tahoori, Mehdi Baradaran %D 2019 %J IEEE Trans. VLSI Syst. %K dblp %N 6 %P 1329-1342 %T Fast and Reliable STT-MRAM Using Nonuniform and Adaptive Error Detecting and Correcting Scheme. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi27.html#SayedBT19 %V 27

@article{journals/tvlsi/SayedBT19, added-at = {2019-07-05T00:00:00.000+0200}, author = {Sayed, Nour and Bishnoi, Rajendra and Tahoori, Mehdi Baradaran}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/235cf2c6701a8323f46d13ea3a5239cc9/dblp}, ee = {https://doi.org/10.1109/TVLSI.2019.2903592}, interhash = {9c738ddf6130210acf2a2ae4a740df9d}, intrahash = {35cf2c6701a8323f46d13ea3a5239cc9}, journal = {IEEE Trans. VLSI Syst.}, keywords = {dblp}, number = 6, pages = {1329-1342}, timestamp = {2019-09-27T06:53:18.000+0200}, title = {Fast and Reliable STT-MRAM Using Nonuniform and Adaptive Error Detecting and Correcting Scheme.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi27.html#SayedBT19}, volume = 27, year = 2019 }