%0 Conference Paper %1 conf/delta/MoY08 %A Mo, Yantu %A Yue, Suge %B DELTA %D 2008 %I IEEE Computer Society %K dblp %P 125-128 %T An Efficient Design of Single Event Transients Tolerance for Logic Circuits. %U http://dblp.uni-trier.de/db/conf/delta/delta2008.html#MoY08 %@ 978-0-7695-3110-6

@inproceedings{conf/delta/MoY08, added-at = {2016-05-18T00:00:00.000+0200}, author = {Mo, Yantu and Yue, Suge}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b7df1e72dc70f58ae2fdc3a9b73a83ee/dblp}, booktitle = {DELTA}, crossref = {conf/delta/2008}, ee = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.9}, interhash = {9a39d77fe265236b981221de2f44dcae}, intrahash = {b7df1e72dc70f58ae2fdc3a9b73a83ee}, isbn = {978-0-7695-3110-6}, keywords = {dblp}, pages = {125-128}, publisher = {IEEE Computer Society}, timestamp = {2016-05-19T09:34:12.000+0200}, title = {An Efficient Design of Single Event Transients Tolerance for Logic Circuits.}, url = {http://dblp.uni-trier.de/db/conf/delta/delta2008.html#MoY08}, year = 2008 }