Article,

Testing aspheric lenses: New approaches

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Optoelectronics, Instrumentation and Data Processing, 46 (4): 329--339 (Aug 1, 2010)
DOI: 10.3103/S8756699010040059

Abstract

Optical metrology provides a unique approach to measuring surfaces, both technical and optical, over a wide measurement range from macro to nano. We present two new approaches to measuring aspheric lenses with increased flexibility. The first is based on a modified Twyman-Green interferometer where multiple sources for the illumination of the aspheric surface with different angles are adopted to achieve a local compensation of the gradient and consequently a reduction of interference fringes. The second is based on a chromatic Fizeau interferometer with a diffractive element as null-optic for the measurement of extreme ultraviolet aspheres.

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