%0 Journal Article %1 journals/mr/DeweerdKCSSRDPEM05 %A Deweerd, W. %A Kaushik, Vidya %A Chen, J. %A Shimamoto, Y. %A Schram, Tom %A Ragnarsson, L.-Å. %A Delabie, Annelies %A Pantisano, Luigi %A Eyckens, B. %A Maes, J. W. %D 2005 %J Microelectronics Reliability %K dblp %N 5-6 %P 786-789 %T Potential remedies for the VT/Vfb-shift problem of Hf/polysilicon-based gate stacks: a solution-based survey. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#DeweerdKCSSRDPEM05 %V 45

@article{journals/mr/DeweerdKCSSRDPEM05, added-at = {2012-11-16T00:00:00.000+0100}, author = {Deweerd, W. and Kaushik, Vidya and Chen, J. and Shimamoto, Y. and Schram, Tom and Ragnarsson, L.-Å. and Delabie, Annelies and Pantisano, Luigi and Eyckens, B. and Maes, J. W.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/236141ef5ca43fe175da688b4ab753abd/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2004.11.048}, interhash = {963d7bf748f27d411163005163ed6af4}, intrahash = {36141ef5ca43fe175da688b4ab753abd}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {5-6}, pages = {786-789}, timestamp = {2016-02-02T02:00:31.000+0100}, title = {Potential remedies for the VT/Vfb-shift problem of Hf/polysilicon-based gate stacks: a solution-based survey.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#DeweerdKCSSRDPEM05}, volume = 45, year = 2005 }