%0 Journal Article %1 journals/mr/MaestroR09 %A Maestro, Juan Antonio %A Reviriego, Pedro %D 2009 %J Microelectronics Reliability %K dblp %N 7 %P 707-715 %T A method to eliminate the event accumulation problem from a memory affected by multiple bit upsets. %U http://dblp.uni-trier.de/db/journals/mr/mr49.html#MaestroR09 %V 49

@article{journals/mr/MaestroR09, added-at = {2010-09-28T00:00:00.000+0200}, author = {Maestro, Juan Antonio and Reviriego, Pedro}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/25525ca31ba2618aa3ea7c1ab1fd3637a/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2009.05.002}, interhash = {911e03b8d957fa0c67f7ea2f8f054fef}, intrahash = {5525ca31ba2618aa3ea7c1ab1fd3637a}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 7, pages = {707-715}, timestamp = {2016-02-02T02:02:35.000+0100}, title = {A method to eliminate the event accumulation problem from a memory affected by multiple bit upsets.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr49.html#MaestroR09}, volume = 49, year = 2009 }