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%0 Conference Paper
%1 conf/vts/CampbellKLMNO96
%A Campbell, R. L.
%A Kuekes, P.
%A Lepejian, David Y.
%A Maly, Wojciech P.
%A Nicolaidis, Michael
%A Orailoglu, Alex
%B VTS
%D 1996
%I IEEE Computer Society
%K dblp
%P 362-363
%T Can Defect-Tolerant Chips Better Meet the Quality Challenge?
%U http://dblp.uni-trier.de/db/conf/vts/vts1996.html#CampbellKLMNO96
%@ 0-8186-7304-4
@inproceedings{conf/vts/CampbellKLMNO96,
added-at = {2014-11-05T00:00:00.000+0100},
author = {Campbell, R. L. and Kuekes, P. and Lepejian, David Y. and Maly, Wojciech P. and Nicolaidis, Michael and Orailoglu, Alex},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a6c66c1b26eb09e7b6b1c948f51ff3f0/dblp},
booktitle = {VTS},
crossref = {conf/vts/1996},
ee = {http://doi.ieeecomputersociety.org/10.1109/VTS.1996.10016},
interhash = {88ebef175fc130fd8bdb99d96ba40cd7},
intrahash = {a6c66c1b26eb09e7b6b1c948f51ff3f0},
isbn = {0-8186-7304-4},
keywords = {dblp},
pages = {362-363},
publisher = {IEEE Computer Society},
timestamp = {2016-02-02T13:39:26.000+0100},
title = {Can Defect-Tolerant Chips Better Meet the Quality Challenge?},
url = {http://dblp.uni-trier.de/db/conf/vts/vts1996.html#CampbellKLMNO96},
year = 1996
}
