%0 Conference Paper %1 conf/irps/LiuCCYKFTLFL18 %A Liu, S. E. %A Chen, G. Y. %A Chen, M. K. %A Yen, David %A Kuo, W. A. %A Fu, C. S. %A Tsai, Y. S. %A Lin, M. Z. %A Fang, Y. H. %A Lin, M. J. %B IRPS %D 2018 %I IEEE %K dblp %P 3 %T Fast chip aging prediction by product-like VMIN drift characterization on test structures. %U http://dblp.uni-trier.de/db/conf/irps/irps2018.html#LiuCCYKFTLFL18 %@ 978-1-5386-5479-8

@inproceedings{conf/irps/LiuCCYKFTLFL18, added-at = {2022-01-19T00:00:00.000+0100}, author = {Liu, S. E. and Chen, G. Y. and Chen, M. K. and Yen, David and Kuo, W. A. and Fu, C. S. and Tsai, Y. S. and Lin, M. Z. and Fang, Y. H. and Lin, M. J.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2dbe399f1ceefb4df61153f597f5c9b27/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2018}, ee = {https://doi.org/10.1109/IRPS.2018.8353569}, interhash = {7cc3cd73b86def351b0fd9c9951f6e8b}, intrahash = {dbe399f1ceefb4df61153f597f5c9b27}, isbn = {978-1-5386-5479-8}, keywords = {dblp}, pages = 3, publisher = {IEEE}, timestamp = {2022-03-01T07:25:50.000+0100}, title = {Fast chip aging prediction by product-like VMIN drift characterization on test structures.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#LiuCCYKFTLFL18}, year = 2018 }