%0 Journal Article %1 journals/mr/Simon-NajasekLL16 %A Simon-Najasek, Michél %A Lorenz, G. %A Lindner, A. %A Altmann, Frank %D 2016 %J Microelectronics Reliability %K dblp %P 248-253 %T Novel failure mode of chip corrosion at automotive HALL sensor devices under multiple stress conditions. %U http://dblp.uni-trier.de/db/journals/mr/mr64.html#Simon-NajasekLL16 %V 64

@article{journals/mr/Simon-NajasekLL16, added-at = {2016-12-22T00:00:00.000+0100}, author = {Simon-Najasek, Michél and Lorenz, G. and Lindner, A. and Altmann, Frank}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2279762d1c532e4993c0c124b3eaae24d/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2016.07.008}, interhash = {79299ebec7561b5f923ba6efa8189fcf}, intrahash = {279762d1c532e4993c0c124b3eaae24d}, journal = {Microelectronics Reliability}, keywords = {dblp}, pages = {248-253}, timestamp = {2016-12-23T10:32:43.000+0100}, title = {Novel failure mode of chip corrosion at automotive HALL sensor devices under multiple stress conditions.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#Simon-NajasekLL16}, volume = 64, year = 2016 }