%0 Conference Paper %1 conf/iccad/ZhuoABS10 %A Zhuo, Cheng %A Agarwal, Kanak %A Blaauw, David T. %A Sylvester, Dennis %B ICCAD %D 2010 %E Scheffer, Louis %E Phillips, Joel R. %E Hu, Alan J. %I IEEE %K dblp %P 508-515 %T Active learning framework for post-silicon variation extraction and test cost reduction. %U http://dblp.uni-trier.de/db/conf/iccad/iccad2010.html#ZhuoABS10 %@ 978-1-4244-8192-7

@inproceedings{conf/iccad/ZhuoABS10, added-at = {2019-02-11T00:00:00.000+0100}, author = {Zhuo, Cheng and Agarwal, Kanak and Blaauw, David T. and Sylvester, Dennis}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/22321acc279f1fbf865afc1ea9331b5a3/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad/2010}, editor = {Scheffer, Louis and Phillips, Joel R. and Hu, Alan J.}, ee = {http://dl.acm.org/citation.cfm?id=2133538}, interhash = {564ebb211f2c15c331aea1b0b5e3268c}, intrahash = {2321acc279f1fbf865afc1ea9331b5a3}, isbn = {978-1-4244-8192-7}, keywords = {dblp}, pages = {508-515}, publisher = {IEEE}, timestamp = {2019-09-27T20:30:46.000+0200}, title = {Active learning framework for post-silicon variation extraction and test cost reduction.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2010.html#ZhuoABS10}, year = 2010 }