%0 Journal Article %1 journals/tvlsi/PengKCW14 %A Peng, Yen-Lin %A Kwai, Ding-Ming %A Chou, Yung-Fa %A Wu, Cheng-Wen %D 2014 %J IEEE Trans. VLSI Syst. %K dblp %N 2 %P 207-219 %T Application-Independent Testing of 3-D Field Programmable Gate Array Interconnect Faults. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi22.html#PengKCW14 %V 22

@article{journals/tvlsi/PengKCW14, added-at = {2014-01-30T00:00:00.000+0100}, author = {Peng, Yen-Lin and Kwai, Ding-Ming and Chou, Yung-Fa and Wu, Cheng-Wen}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2350ac8b1259d3aadcbe6cc5d3a53111f/dblp}, ee = {http://dx.doi.org/10.1109/TVLSI.2013.2242100}, interhash = {52c7288af3ac57ac50947c18bce3b15f}, intrahash = {350ac8b1259d3aadcbe6cc5d3a53111f}, journal = {IEEE Trans. VLSI Syst.}, keywords = {dblp}, number = 2, pages = {207-219}, timestamp = {2016-02-02T02:11:59.000+0100}, title = {Application-Independent Testing of 3-D Field Programmable Gate Array Interconnect Faults.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi22.html#PengKCW14}, volume = 22, year = 2014 }