%0 Conference Paper %1 parihar2024impact %A Parihar, Shivendra Singh %A Pahwa, Girish %A Chauhan, Yogesh S. %A Amrouch, Hussam %B 2024 IEEE International Reliability Physics Symposium (IRPS) %D 2024 %I IEEE %K %R 10.1109/IRPS48228.2024.10529431 %T Impact of Self-Heating in 5nm FinFETs at Cryogenic Temperatures for Reliable Quantum Computing : Device-Circuit Interaction %@ 979-8-3503-6976-2 and 979-8-3503-6977-9

@inproceedings{parihar2024impact, added-at = {2025-01-13T14:12:14.000+0100}, affiliation = {Amrouch, H (Corresponding Author), Tech Univ Munich, Chair AI Processor Design, Munich Inst Robot \& Machine Intelligence, Munich, Germany. Parihar, Shivendra Singh, Univ Stuttgart, Semicond Test \& Reliabil, Stuttgart, Germany. Parihar, Shivendra Singh; Chauhan, Yogesh S., Indian Inst Technol Kanpur, Kanpur, Uttar Pradesh, India. Pahwa, Girish, Univ Calif Berkeley Berkeley, Berkeley, CA USA. Amrouch, Hussam, Tech Univ Munich, Chair AI Processor Design, Munich Inst Robot \& Machine Intelligence, Munich, Germany.}, author = {Parihar, Shivendra Singh and Pahwa, Girish and Chauhan, Yogesh S. and Amrouch, Hussam}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2d412d5356855de9ae46823e806b3e50a/unibiblio}, booktitle = {2024 IEEE International Reliability Physics Symposium (IRPS)}, doi = {10.1109/IRPS48228.2024.10529431}, eventdate = {2024-04-14/2024-04-18}, eventtitle = {2024 IEEE International Reliability Physics Symposium (IRPS)}, interhash = {14c1cbf4717d5f8537dacbc5cf460320}, intrahash = {d412d5356855de9ae46823e806b3e50a}, isbn = {{979-8-3503-6976-2} and {979-8-3503-6977-9}}, keywords = {}, language = {eng}, publisher = {IEEE}, research-areas = {Engineering; Physics}, timestamp = {2025-01-13T13:12:14.000+0100}, title = {Impact of Self-Heating in 5nm FinFETs at Cryogenic Temperatures for Reliable Quantum Computing : Device-Circuit Interaction}, unique-id = {WOS:001229691100108}, venue = {Grapevine, USA}, year = 2024 }