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%0 Journal Article
%1 mei2021effect
%A Mei, J.
%A Haug, R.
%A Grözinger, T.
%A Zimmermann, André
%D 2021
%I Elsevier
%J Microelectronics reliability
%K
%N July
%P 114151
%R 10.1016/j.microrel.2021.114151
%T Effect of high current pulses on solder interfacial reaction and interconnect reliability
%V 122
@article{mei2021effect,
added-at = {2023-08-31T16:44:26.000+0200},
affiliation = {Mei, J (Corresponding Author), Robert Bosch GmbH, Robert Bosch Str 2, D-71701 Schwieberdingen, Germany.
Mei, J.; Haug, R., Robert Bosch GmbH, Robert Bosch Str 2, D-71701 Schwieberdingen, Germany.
Groezinger, T.; Zimmermann, A., Hahn Schickard, Allmandring 9B, D-70569 Stuttgart, Germany.
Zimmermann, A., Univ Stuttgart, Inst Micro Integrat IFM, Allmandring 9B, D-70569 Stuttgart, Germany.},
author = {Mei, J. and Haug, R. and Grözinger, T. and Zimmermann, André},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2ec485bc8712827dd58508b086f921a88/puma-wartung},
doi = {10.1016/j.microrel.2021.114151},
interhash = {13b7d6defa8ddbf3cc3da4a21c289e87},
intrahash = {ec485bc8712827dd58508b086f921a88},
issn = {0026-2714},
journal = {Microelectronics reliability},
keywords = {},
language = {eng},
number = {July},
pages = 114151,
publisher = {Elsevier},
research-areas = {Engineering; Science & Technology - Other Topics; Physics},
timestamp = {2023-08-31T14:44:26.000+0200},
title = {Effect of high current pulses on solder interfacial reaction and interconnect reliability},
unique-id = {ISI:000659230300005},
volume = 122,
year = 2021
}