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%0 Journal Article
%1 journals/mr/GarrosCRFRMWB09
%A Garros, Xavier
%A Casse, Mikaël
%A Rafik, M.
%A Fenouillet-Béranger, Claire
%A Reimbold, Gilles
%A Martin, F.
%A Wiemer, C.
%A Boulanger, F.
%D 2009
%J Microelectronics Reliability
%K dblp
%N 9-11
%P 982-988
%T Process dependence of BTI reliability in advanced HK MG stacks.
%U http://dblp.uni-trier.de/db/journals/mr/mr49.html#GarrosCRFRMWB09
%V 49
@article{journals/mr/GarrosCRFRMWB09,
added-at = {2019-07-10T00:00:00.000+0200},
author = {Garros, Xavier and Casse, Mikaël and Rafik, M. and Fenouillet-Béranger, Claire and Reimbold, Gilles and Martin, F. and Wiemer, C. and Boulanger, F.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/260eed095c1469e84179d84d2a6eec2ff/dblp},
ee = {https://www.wikidata.org/entity/Q57387398},
interhash = {3b48558c5f7ba67d4457f15cb3b7d4e9},
intrahash = {60eed095c1469e84179d84d2a6eec2ff},
journal = {Microelectronics Reliability},
keywords = {dblp},
number = {9-11},
pages = {982-988},
timestamp = {2019-09-27T10:58:31.000+0200},
title = {Process dependence of BTI reliability in advanced HK MG stacks.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr49.html#GarrosCRFRMWB09},
volume = 49,
year = 2009
}
