%0 Journal Article %1 journals/computer/BhattacharyaMH89 %A Bhattacharya, Debashis %A Murray, Brian T. %A Hayes, John P. %D 1989 %J IEEE Computer %K dblp %N 4 %P 16-24 %T High-Level Test Generation for VLSI. %U http://dblp.uni-trier.de/db/journals/computer/computer22.html#BhattacharyaMH89 %V 22

@article{journals/computer/BhattacharyaMH89, added-at = {2015-12-16T00:00:00.000+0100}, author = {Bhattacharya, Debashis and Murray, Brian T. and Hayes, John P.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2655dc9cfc18c853763824dc154069e3a/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/2.25379}, interhash = {39fe1c0d3b84baa8d8bfd65e0a71f984}, intrahash = {655dc9cfc18c853763824dc154069e3a}, journal = {IEEE Computer}, keywords = {dblp}, number = 4, pages = {16-24}, timestamp = {2016-02-02T09:47:36.000+0100}, title = {High-Level Test Generation for VLSI.}, url = {http://dblp.uni-trier.de/db/journals/computer/computer22.html#BhattacharyaMH89}, volume = 22, year = 1989 }