%0 Journal Article %1 journals/tcad/LeeS11 %A Lee, Jongeun %A Shrivastava, Aviral %D 2011 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 4 %P 607-616 %T Static Analysis of Register File Vulnerability. %U http://dblp.uni-trier.de/db/journals/tcad/tcad30.html#LeeS11 %V 30

@article{journals/tcad/LeeS11, added-at = {2011-04-20T00:00:00.000+0200}, author = {Lee, Jongeun and Shrivastava, Aviral}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2fb3fd3148c3f2931f467f87e5b58e5e4/dblp}, ee = {http://dx.doi.org/10.1109/TCAD.2010.2095630}, interhash = {328220f0863ca1ef826fbb343becb035}, intrahash = {fb3fd3148c3f2931f467f87e5b58e5e4}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 4, pages = {607-616}, timestamp = {2016-02-02T10:08:11.000+0100}, title = {Static Analysis of Register File Vulnerability.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad30.html#LeeS11}, volume = 30, year = 2011 }