%0 Conference Paper %1 conf/5gwf/LeHWKZL19 %A Le, Quang Huy %A Huynh, Dang Khoa %A Wang, Defu %A Kämpfe, Thomas %A Zhao, Zhixing %A Lehmann, Steffen %B 5G World Forum %D 2019 %I IEEE %K dblp %P 7-10 %T Assessment of a Thick-Oxide Transistor from the 22FDX® Platform for 5G NR sub-6 GHz FEMs. %U http://dblp.uni-trier.de/db/conf/5gwf/5gwf2019.html#LeHWKZL19 %@ 978-1-7281-3627-1

@inproceedings{conf/5gwf/LeHWKZL19, added-at = {2019-12-06T00:00:00.000+0100}, author = {Le, Quang Huy and Huynh, Dang Khoa and Wang, Defu and Kämpfe, Thomas and Zhao, Zhixing and Lehmann, Steffen}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/280028a6b39cb719b5938a484b5b7e37c/dblp}, booktitle = {5G World Forum}, crossref = {conf/5gwf/2019}, ee = {https://doi.org/10.1109/5GWF.2019.8911632}, interhash = {29ea86887cf8203059160928e71c00f9}, intrahash = {80028a6b39cb719b5938a484b5b7e37c}, isbn = {978-1-7281-3627-1}, keywords = {dblp}, pages = {7-10}, publisher = {IEEE}, timestamp = {2019-12-11T13:01:27.000+0100}, title = {Assessment of a Thick-Oxide Transistor from the 22FDX® Platform for 5G NR sub-6 GHz FEMs.}, url = {http://dblp.uni-trier.de/db/conf/5gwf/5gwf2019.html#LeHWKZL19}, year = 2019 }