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%0 Conference Paper
%1 conf/5gwf/LeHWKZL19
%A Le, Quang Huy
%A Huynh, Dang Khoa
%A Wang, Defu
%A Kämpfe, Thomas
%A Zhao, Zhixing
%A Lehmann, Steffen
%B 5G World Forum
%D 2019
%I IEEE
%K dblp
%P 7-10
%T Assessment of a Thick-Oxide Transistor from the 22FDX® Platform for 5G NR sub-6 GHz FEMs.
%U http://dblp.uni-trier.de/db/conf/5gwf/5gwf2019.html#LeHWKZL19
%@ 978-1-7281-3627-1
@inproceedings{conf/5gwf/LeHWKZL19,
added-at = {2019-12-06T00:00:00.000+0100},
author = {Le, Quang Huy and Huynh, Dang Khoa and Wang, Defu and Kämpfe, Thomas and Zhao, Zhixing and Lehmann, Steffen},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/280028a6b39cb719b5938a484b5b7e37c/dblp},
booktitle = {5G World Forum},
crossref = {conf/5gwf/2019},
ee = {https://doi.org/10.1109/5GWF.2019.8911632},
interhash = {29ea86887cf8203059160928e71c00f9},
intrahash = {80028a6b39cb719b5938a484b5b7e37c},
isbn = {978-1-7281-3627-1},
keywords = {dblp},
pages = {7-10},
publisher = {IEEE},
timestamp = {2019-12-11T13:01:27.000+0100},
title = {Assessment of a Thick-Oxide Transistor from the 22FDX® Platform for 5G NR sub-6 GHz FEMs.},
url = {http://dblp.uni-trier.de/db/conf/5gwf/5gwf2019.html#LeHWKZL19},
year = 2019
}