%0 Conference Paper %1 conf/iccd/LiuO05 %A Liu, Fang %A Ozev, Sule %B ICCD %D 2005 %I IEEE Computer Society %K dblp %P 161-170 %T Fast Hierarchical Process Variability Analysis and Parametric Test Development for Analog/RF Circuits. %U http://dblp.uni-trier.de/db/conf/iccd/iccd2005.html#LiuO05 %@ 0-7695-2451-6

@inproceedings{conf/iccd/LiuO05, added-at = {2014-09-22T00:00:00.000+0200}, author = {Liu, Fang and Ozev, Sule}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2391d1b65aff4dc8f47d012f43b43be1b/dblp}, booktitle = {ICCD}, crossref = {conf/iccd/2005}, ee = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2005.54}, interhash = {286fcbc2ee3f762464256c22741fd5e4}, intrahash = {391d1b65aff4dc8f47d012f43b43be1b}, isbn = {0-7695-2451-6}, keywords = {dblp}, pages = {161-170}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T15:08:20.000+0100}, title = {Fast Hierarchical Process Variability Analysis and Parametric Test Development for Analog/RF Circuits.}, url = {http://dblp.uni-trier.de/db/conf/iccd/iccd2005.html#LiuO05}, year = 2005 }