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%0 Conference Paper
%1 conf/iccd/LiuO05
%A Liu, Fang
%A Ozev, Sule
%B ICCD
%D 2005
%I IEEE Computer Society
%K dblp
%P 161-170
%T Fast Hierarchical Process Variability Analysis and Parametric Test Development for Analog/RF Circuits.
%U http://dblp.uni-trier.de/db/conf/iccd/iccd2005.html#LiuO05
%@ 0-7695-2451-6
@inproceedings{conf/iccd/LiuO05,
added-at = {2014-09-22T00:00:00.000+0200},
author = {Liu, Fang and Ozev, Sule},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2391d1b65aff4dc8f47d012f43b43be1b/dblp},
booktitle = {ICCD},
crossref = {conf/iccd/2005},
ee = {http://doi.ieeecomputersociety.org/10.1109/ICCD.2005.54},
interhash = {286fcbc2ee3f762464256c22741fd5e4},
intrahash = {391d1b65aff4dc8f47d012f43b43be1b},
isbn = {0-7695-2451-6},
keywords = {dblp},
pages = {161-170},
publisher = {IEEE Computer Society},
timestamp = {2016-02-02T15:08:20.000+0100},
title = {Fast Hierarchical Process Variability Analysis and Parametric Test Development for Analog/RF Circuits.},
url = {http://dblp.uni-trier.de/db/conf/iccd/iccd2005.html#LiuO05},
year = 2005
}
