%0 Conference Paper %1 conf/vlsid/BahukudumbiB05 %A Bahukudumbi, Sudarshan %A Bharath, Krishna %B VLSI Design %D 2005 %I IEEE Computer Society %K dblp %P 804-807 %T A Low Overhead High Speed Histogram Based Test Methodology for Analog Circuits and IP Cores. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2005.html#BahukudumbiB05 %@ 0-7695-2264-5

@inproceedings{conf/vlsid/BahukudumbiB05, added-at = {2017-05-23T00:00:00.000+0200}, author = {Bahukudumbi, Sudarshan and Bharath, Krishna}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e99659389635a867855191d422072843/dblp}, booktitle = {VLSI Design}, crossref = {conf/vlsid/2005}, ee = {http://doi.ieeecomputersociety.org/10.1109/ICVD.2005.16}, interhash = {1f267fdf8dc0f5a27fe8c01cc34affa3}, intrahash = {e99659389635a867855191d422072843}, isbn = {0-7695-2264-5}, keywords = {dblp}, pages = {804-807}, publisher = {IEEE Computer Society}, timestamp = {2019-09-27T18:12:10.000+0200}, title = {A Low Overhead High Speed Histogram Based Test Methodology for Analog Circuits and IP Cores.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2005.html#BahukudumbiB05}, year = 2005 }