%0 Journal Article %1 journals/mr/TangYWLFCFZ17 %A Tang, Hongyu %A Ye, Huaiyu %A Wong, Cell K. Y. %A Leung, Stanely Y. Y. %A Fan, Jiajie %A Chen, Xianping %A Fan, Xuejun %A Zhang, Guoqi %D 2017 %J Microelectronics Reliability %K dblp %P 197-204 %T Overdriving reliability of chip scale packaged LEDs: Quantitatively analyzing the impact of component. %U http://dblp.uni-trier.de/db/journals/mr/mr78.html#TangYWLFCFZ17 %V 78

@article{journals/mr/TangYWLFCFZ17, added-at = {2019-12-27T00:00:00.000+0100}, author = {Tang, Hongyu and Ye, Huaiyu and Wong, Cell K. Y. and Leung, Stanely Y. Y. and Fan, Jiajie and Chen, Xianping and Fan, Xuejun and Zhang, Guoqi}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2c239d1dae42d646f9f2dbb6bd6dedbfb/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.09.008}, interhash = {198e60bc52f686ce55bc730a9f4e2442}, intrahash = {c239d1dae42d646f9f2dbb6bd6dedbfb}, journal = {Microelectronics Reliability}, keywords = {dblp}, pages = {197-204}, timestamp = {2020-01-09T07:46:12.000+0100}, title = {Overdriving reliability of chip scale packaged LEDs: Quantitatively analyzing the impact of component.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr78.html#TangYWLFCFZ17}, volume = 78, year = 2017 }