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%0 Journal Article
%1 journals/mr/TangYWLFCFZ17
%A Tang, Hongyu
%A Ye, Huaiyu
%A Wong, Cell K. Y.
%A Leung, Stanely Y. Y.
%A Fan, Jiajie
%A Chen, Xianping
%A Fan, Xuejun
%A Zhang, Guoqi
%D 2017
%J Microelectronics Reliability
%K dblp
%P 197-204
%T Overdriving reliability of chip scale packaged LEDs: Quantitatively analyzing the impact of component.
%U http://dblp.uni-trier.de/db/journals/mr/mr78.html#TangYWLFCFZ17
%V 78
@article{journals/mr/TangYWLFCFZ17,
added-at = {2019-12-27T00:00:00.000+0100},
author = {Tang, Hongyu and Ye, Huaiyu and Wong, Cell K. Y. and Leung, Stanely Y. Y. and Fan, Jiajie and Chen, Xianping and Fan, Xuejun and Zhang, Guoqi},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2c239d1dae42d646f9f2dbb6bd6dedbfb/dblp},
ee = {https://doi.org/10.1016/j.microrel.2017.09.008},
interhash = {198e60bc52f686ce55bc730a9f4e2442},
intrahash = {c239d1dae42d646f9f2dbb6bd6dedbfb},
journal = {Microelectronics Reliability},
keywords = {dblp},
pages = {197-204},
timestamp = {2020-01-09T07:46:12.000+0100},
title = {Overdriving reliability of chip scale packaged LEDs: Quantitatively analyzing the impact of component.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr78.html#TangYWLFCFZ17},
volume = 78,
year = 2017
}
