Bloos, D (Reprint Author), Univ Stuttgart, Inst Phys Chem, Pfaffenwaldring 55, D-70569 Stuttgart, Germany.
Bloos, D.; Kaeswurm, L.; van Slageren, J.; Neugebauer, P., Univ Stuttgart, Inst Phys Chem, Pfaffenwaldring 55, D-70569 Stuttgart, Germany.
Kunc, J., Charles Univ Prague, Fac Math & Phys, Inst Phys, Ke Karlovu 5, CZ-12116 Prague 2, Czech Republic.
Myers-Ward, R. L.; Daniels, K.; DeJarld, M.; Gaskill, D. K., US Naval Res Lab, 4555 Overlook Ave SW, Washington, DC 20375 USA.
Daniels, K., Univ Maryland, Inst Res Elect & Appl Phys, College Pk, MD 20742 USA.
Nath, A., George Mason Univ, 4400 Univ Dr, Fairfax, VA 22030 USA.
Neugebauer, P., Brno Univ Technol, CEITEC BUT, Purkynova 123, Brno 61200, Czech Republic.
orcid-numbers
Kunc, Jan/0000-0001-8197-0890
van Slageren, Joris/0000-0002-0855-8960
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%0 Journal Article
%1 bloos2019contactless
%A Bloos, Dominik
%A Kunc, J.
%A Kaeswurm, L.
%A Myers-Ward, R. L.
%A Daniels, K.
%A DeJarld, M.
%A Nath, A.
%A van Slageren, Joris
%A Gaskill, D. K.
%A Neugebauer, P.
%D 2019
%I IOP Publishing
%J 2D Materials
%K
%N 3
%P 035028
%R 10.1088/2053-1583/ab1d7e
%T Contactless millimeter wave method for quality assessment of large area graphene
%V 6
@article{bloos2019contactless,
added-at = {2023-08-31T16:10:29.000+0200},
affiliation = {Bloos, D (Reprint Author), Univ Stuttgart, Inst Phys Chem, Pfaffenwaldring 55, D-70569 Stuttgart, Germany.
Bloos, D.; Kaeswurm, L.; van Slageren, J.; Neugebauer, P., Univ Stuttgart, Inst Phys Chem, Pfaffenwaldring 55, D-70569 Stuttgart, Germany.
Kunc, J., Charles Univ Prague, Fac Math & Phys, Inst Phys, Ke Karlovu 5, CZ-12116 Prague 2, Czech Republic.
Myers-Ward, R. L.; Daniels, K.; DeJarld, M.; Gaskill, D. K., US Naval Res Lab, 4555 Overlook Ave SW, Washington, DC 20375 USA.
Daniels, K., Univ Maryland, Inst Res Elect & Appl Phys, College Pk, MD 20742 USA.
Nath, A., George Mason Univ, 4400 Univ Dr, Fairfax, VA 22030 USA.
Neugebauer, P., Brno Univ Technol, CEITEC BUT, Purkynova 123, Brno 61200, Czech Republic.},
author = {Bloos, Dominik and Kunc, J. and Kaeswurm, L. and Myers-Ward, R. L. and Daniels, K. and DeJarld, M. and Nath, A. and van Slageren, Joris and Gaskill, D. K. and Neugebauer, P.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a06c6545506561e23e4903d127df1862/puma-wartung},
doi = {10.1088/2053-1583/ab1d7e},
interhash = {16e41a87c7571e8949d5851e0841c5d8},
intrahash = {a06c6545506561e23e4903d127df1862},
issn = {2053-1583},
journal = {2D Materials},
keywords = {},
language = {eng},
number = 3,
orcid-numbers = {Kunc, Jan/0000-0001-8197-0890
van Slageren, Joris/0000-0002-0855-8960},
pages = 035028,
publisher = {IOP Publishing},
research-areas = {Materials Science},
researcherid-numbers = {Kunc, Jan/E-6436-2013},
timestamp = {2023-08-31T14:10:29.000+0200},
title = {Contactless millimeter wave method for quality assessment of large area graphene},
unique-id = {ISI:000468335500002},
volume = 6,
year = 2019
}