%0 Journal Article %1 journals/tcad/ChanGHKK17 %A Chan, Tuck-Boon %A Gupta, Puneet %A Han, Kwangsoo %A Kagalwalla, Abde Ali %A Kahng, Andrew B. %D 2017 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 1 %P 170-183 %T Benchmarking of Mask Fracturing Heuristics. %U http://dblp.uni-trier.de/db/journals/tcad/tcad36.html#ChanGHKK17 %V 36

@article{journals/tcad/ChanGHKK17, added-at = {2017-01-06T00:00:00.000+0100}, author = {Chan, Tuck-Boon and Gupta, Puneet and Han, Kwangsoo and Kagalwalla, Abde Ali and Kahng, Andrew B.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2fb384249bd378c7c8345f0100365f8fc/dblp}, ee = {http://dx.doi.org/10.1109/TCAD.2016.2620902}, interhash = {0c59576bcd8833dfb835feda2082c692}, intrahash = {fb384249bd378c7c8345f0100365f8fc}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 1, pages = {170-183}, timestamp = {2017-01-07T10:36:01.000+0100}, title = {Benchmarking of Mask Fracturing Heuristics.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad36.html#ChanGHKK17}, volume = 36, year = 2017 }