%0 Journal Article %1 hietzschold2017functionalized %A Hietzschold, Sebastian %A Hillebrandt, Sabina %A Ullrich, Florian %A Bombsch, Jakob %A Rohnacher, Valentina %A Ma, Shuangying %A Liu, Wenlan %A Köhn, Andreas %A Jaegermann, Wolfram %A Pucci, Annemarie %A Kowalsky, Wolfgang %A Mankel, Eric %A Beck, Sebastian %A Lovrincic, Robert %D 2017 %I American Chemical Society %J ACS applied materials & interfaces %K %N 45 %P 39821-39829 %R 10.1021/acsami.7b12784 %T Functionalized Nickel Oxide Hole Contact Layers: Work Function versus Conductivity %V 9

@article{hietzschold2017functionalized, added-at = {2023-08-31T16:23:36.000+0200}, affiliation = {Hietzschold, S; Lovrincic, R (Reprint Author), lnnovationLab, Speyerer Str 4, D-69115 Heidelberg, Germany. Hietzschold, S; Lovrincic, R (Reprint Author), TU Braunschweig, Inst High Frequency Technol, Schleinitzstr 22, D-38106 Braunschweig, Germany. Hietzschold, S (Reprint Author), Heidelberg Univ, Kirchhoff Inst Phys, Neuenheimer Feld 227, D-69120 Heidelberg, Germany. Hietzschold, Sebastian; Hillebrandt, Sabina; Ullrich, Florian; Bombsch, Jakob; Rohnacher, Valentina; Ma, Shuangying; Liu, Wenlan; Koehn, Andreas; Jaegermann, Wolfram; Pucci, Annemarie; Kowalsky, Wolfgang; Mankel, Eric; Beck, Sebastian; Lovrincic, Robert, lnnovationLab, Speyerer Str 4, D-69115 Heidelberg, Germany. Hietzschold, Sebastian; Kowalsky, Wolfgang; Lovrincic, Robert, TU Braunschweig, Inst High Frequency Technol, Schleinitzstr 22, D-38106 Braunschweig, Germany. Hietzschold, Sebastian; Hillebrandt, Sabina; Bombsch, Jakob; Rohnacher, Valentina; Pucci, Annemarie; Beck, Sebastian, Heidelberg Univ, Kirchhoff Inst Phys, Neuenheimer Feld 227, D-69120 Heidelberg, Germany. Ullrich, Florian; Jaegermann, Wolfram; Mankel, Eric, Tech Univ Darmstadt, Surface Sci Div, Jovanka Bontschits Str 2, D-64287 Darmstadt, Germany. Pucci, Annemarie, Heidelberg Univ, Ctr Adv Mat, Neuenheimer Feld, D-69120 Heidelberg, Germany. Ma, Shuangying; Liu, Wenlan; Koehn, Andreas, Univ Stuttgart, Inst Theoret Chem, Pfaffenwaldring 55, D-70569 Stuttgart, Germany.}, author = {Hietzschold, Sebastian and Hillebrandt, Sabina and Ullrich, Florian and Bombsch, Jakob and Rohnacher, Valentina and Ma, Shuangying and Liu, Wenlan and Köhn, Andreas and Jaegermann, Wolfram and Pucci, Annemarie and Kowalsky, Wolfgang and Mankel, Eric and Beck, Sebastian and Lovrincic, Robert}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2c49d230b1c4c001f68845b1bfcbc5f4c/puma-wartung}, doi = {10.1021/acsami.7b12784}, interhash = {09c0cf1b977c3892f63dd8aadcdd1290}, intrahash = {c49d230b1c4c001f68845b1bfcbc5f4c}, issn = {1944-8244}, journal = {ACS applied materials & interfaces}, keywords = {}, language = {eng}, number = 45, orcid-numbers = {Lovrincic, Robert/0000-0001-5429-5586}, pages = {39821-39829}, publisher = {American Chemical Society}, research-areas = {Science & Technology - Other Topics; Materials Science}, timestamp = {2023-08-31T14:23:36.000+0200}, title = {Functionalized Nickel Oxide Hole Contact Layers: Work Function versus Conductivity}, unique-id = {ISI:000416203800076}, volume = 9, year = 2017 }