%0 Journal Article %1 journals/esticas/MitraBKLL11 %A Mitra, Subhasish %A Brelsford, Kevin %A Kim, Young Moon %A Lee, Hsiao-Heng %A Li, Yanjing %D 2011 %J IEEE J. Emerg. Sel. Topics Circuits Syst. %K dblp %N 1 %P 30-41 %T Robust System Design to Overcome CMOS Reliability Challenges. %U http://dblp.uni-trier.de/db/journals/esticas/esticas1.html#MitraBKLL11 %V 1

@article{journals/esticas/MitraBKLL11, added-at = {2013-03-11T00:00:00.000+0100}, author = {Mitra, Subhasish and Brelsford, Kevin and Kim, Young Moon and Lee, Hsiao-Heng and Li, Yanjing}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/20b9ead2c24f9106b3e8fb8e90c064695/dblp}, ee = {http://dx.doi.org/10.1109/JETCAS.2011.2135630}, interhash = {04f6f54c84b573c2a57d6731061210b6}, intrahash = {0b9ead2c24f9106b3e8fb8e90c064695}, journal = {IEEE J. Emerg. Sel. Topics Circuits Syst.}, keywords = {dblp}, number = 1, pages = {30-41}, timestamp = {2016-02-02T05:20:04.000+0100}, title = {Robust System Design to Overcome CMOS Reliability Challenges.}, url = {http://dblp.uni-trier.de/db/journals/esticas/esticas1.html#MitraBKLL11}, volume = 1, year = 2011 }