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Disambiguation of "Linten, Dimitri"

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Impact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET maps.

, , , , , , and . IRPS, page 5. IEEE, (2018)

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Dimitri Evcenko University of Stuttgart

Dimitri Graf University of Stuttgart

Dr. rer. pol. Dimitri Petrik University of Stuttgart

Hans Dimitri Papdo Tchasse University of Stuttgart

 

Other publications of authors with the same name

RF ESD protection strategies - the design and performance trade-off challenges., , , , , , , , , and 5 other author(s). CICC, page 489-496. IEEE, (2005)A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability., , , , , , , , , and 4 other author(s). Microelectronics Reliability, (2018)New Insights into the Imprint Effect in FE-HfO2 and its Recovery., , , , , , , , , and 3 other author(s). IRPS, page 1-7. IEEE, (2019)The defect-centric perspective of device and circuit reliability - From individual defects to circuits., , , , , , , , , and 5 other author(s). ESSDERC, page 218-225. IEEE, (2015)Extended Subspace Identification of Improper Linear Systems., , , and . DATE, page 454-459. IEEE Computer Society, (2004)Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants., , , , , , , , , and 1 other author(s). ESSDERC, page 262-265. IEEE, (2019)ESD protection diodes in optical interposer technology., , , , , , and . ICICDT, page 1-4. IEEE, (2015)Self-heating-aware CMOS reliability characterization using degradation maps., , , , , , , and . IRPS, page 2. IEEE, (2018)Impact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET maps., , , , , , and . IRPS, page 5. IEEE, (2018)Gate-Stack Engineered NBTI Improvements in Highvoltage Logic-For-Memory High-ĸ/Metal Gate Devices., , , , , , , , , and 6 other author(s). IRPS, page 1-8. IEEE, (2019)