%0 Conference Paper %1 conf/irps/PutchaFVKSLG18 %A Putcha, V. %A Franco, Jacopo %A Vais, Abhitosh %A Kaczer, Ben %A Sioncke, S. %A Linten, Dimitri %A Groeseneken, Guido %B IRPS %D 2018 %I IEEE %K dblp %P 5 %T Impact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET maps. %U http://dblp.uni-trier.de/db/conf/irps/irps2018.html#PutchaFVKSLG18 %@ 978-1-5386-5479-8

@inproceedings{conf/irps/PutchaFVKSLG18, added-at = {2019-01-22T00:00:00.000+0100}, author = {Putcha, V. and Franco, Jacopo and Vais, Abhitosh and Kaczer, Ben and Sioncke, S. and Linten, Dimitri and Groeseneken, Guido}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/20960ea588c9caa8b87c9c3bb1929c790/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2018}, ee = {https://doi.org/10.1109/IRPS.2018.8353603}, interhash = {5f03c323cf8d011bc0a121f7dc13de5e}, intrahash = {0960ea588c9caa8b87c9c3bb1929c790}, isbn = {978-1-5386-5479-8}, keywords = {dblp}, pages = 5, publisher = {IEEE}, timestamp = {2019-09-27T13:33:22.000+0200}, title = {Impact of slow and fast oxide traps on In0.53Ga0.47As device operation studied using CET maps.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#PutchaFVKSLG18}, year = 2018 }