Modeling and Investigating Total Ionizing Dose Impact on FeFET. IEEE journal on exploratory solid-state computational devices and circuits, (9)2:143-150, IEEE, 2023. [PUMA: oa ubs_10005 ubs_20008 ubs_30085 ubs_40416 unibibliografie wos]
Modeling and Investigating Total Ionizing Dose Impact on FeFET. IEEE journal on exploratory solid-state computational devices and circuits, (9)2:143-150, IEEE, 2023. [PUMA: f2023 gold oa oafonds ubs_10005 ubs_20008 ubs_30085 ubs_40416 unibibliografie]
Reliable Hyperdimensional Reasoning on Unreliable Emerging Technologies. 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD) 2023, IEEE, 2023. [PUMA: ubs_10005 ubs_20008 ubs_30085 ubs_40416 unibibliografie wos]
Ultra-Efficient Edge AI using FeFET-based Monolithic 3D Integration. 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD) 2023, IEEE, 2023. [PUMA: ubs_10005 ubs_20008 ubs_30085 ubs_40416 unibibliografie wos]
First demonstration of in-memory computing crossbar using multi-level Cell FeFET. Nature communications, (14):6348, Nature Publishing Group, 2023. [PUMA: oa ubs_10005 ubs_20008 ubs_30085 ubs_40416 unibibliografie wos]
Stress-resiliency of AI Implementations on FPGAs. In N. Mentens, L. Sousa, P. Trancoso, N. Papadopoulou, and I. Sourdis (Eds.), 2023 33rd International Conference on Field-Programmable Logic and Applications (FPL), 333-338, IEEE, 2023. [PUMA: ubs_10005 ubs_20008 ubs_30085 ubs_40416 unibibliografie wos]
Powering Disturb-Free Reconfigurable Computing and Tunable Analog Electronics with Dual-Port Ferroelectric FET. ACS applied materials & interfaces, (15)47:54602-54610, American Chemical Society, 2023. [PUMA: ubs_10005 ubs_20008 ubs_30085 unibibliografie wos]
BEOL FeFET SPICE-Compatible Model for Benchmarking 3-D Monolithic In-Memory TCAM Computation. IEEE transactions on electron devices, (70)12:6286-6292, IEEE, 2023. [PUMA: ubs_10005 ubs_20008 ubs_30085 unibibliografie wos]
Programmable Delay Element Using Dual-Port FeFET for Post-Silicon Clock Tuning. IEEE electron device letters, (44)11:1907-1910, IEEE, 2023. [PUMA: ubs_10005 ubs_20008 ubs_30085 unibibliografie wos]
Comprehensive Modeling of Switching Behavior in BEOL FeFET for Monolithic 3-D Integration. IEEE transactions on electron devices, (71)1:368-373, IEEE, 2024. [PUMA: ubs_10020008 ubs_30085 unibibliografie wos]