%0 Journal Article %1 kumar2024comprehensive %A Kumar, Shubham %A Thomann, Simon %A Prakash, Om %A Ni, Kai %A Chauhan, Yogesh Singh %A Amrouch, Hussam %D 2024 %I IEEE %J IEEE transactions on electron devices %K ubs_10020008 ubs_30085 unibibliografie wos %N 1 %P 368-373 %R 10.1109/TED.2023.3321860 %T Comprehensive Modeling of Switching Behavior in BEOL FeFET for Monolithic 3-D Integration %V 71

@article{kumar2024comprehensive, added-at = {2024-02-23T11:55:19.000+0100}, affiliation = {Kumar, S (Corresponding Author), Univ Stuttgart, Chair Semicond Test & Reliabil STAR, Stuttgart, Germany. Kumar, Shubham, Univ Stuttgart, Chair Semicond Test & Reliabil STAR, Stuttgart, Germany. Kumar, Shubham; Chauhan, Yogesh Singh, Indian Inst Technol Kanpur IITK, Kanpur 208016, India. Thomann, Simon, Univ Stuttgart, Chair Semicond Test & Reliabil STAR, D-70550 Stuttgart, Germany. Ni, Kai, Univ Notre Dame, Dept Elect Engn, Notre Dame, IN 46556 USA. Amrouch, Hussam, Tech Univ Munich, Munich Inst Robot & Machine Intelligence, TUM Sch Computat Informat & Technol, D-80333 Munich, Germany.}, author = {Kumar, Shubham and Thomann, Simon and Prakash, Om and Ni, Kai and Chauhan, Yogesh Singh and Amrouch, Hussam}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/20ea5e97e7331aa6ba091688eb8e9ecb2/unibiblio}, doi = {10.1109/TED.2023.3321860}, interhash = {40e3a85e31b18f563d7765f065956ef5}, intrahash = {0ea5e97e7331aa6ba091688eb8e9ecb2}, issn = {{0018-9383} and {1557-9646}}, journal = {IEEE transactions on electron devices}, keywords = {ubs_10020008 ubs_30085 unibibliografie wos}, language = {eng}, number = 1, pages = {368-373}, publisher = {IEEE}, research-areas = {Engineering; Physics}, timestamp = {2024-02-23T11:55:19.000+0100}, title = {Comprehensive Modeling of Switching Behavior in BEOL FeFET for Monolithic 3-D Integration}, unique-id = {WOS:001097075100001}, volume = 71, year = 2024 }