%0 Journal Article %1 journals/mr/WelTBLHGRBP06 %A van der Wel, P. J. %A Theeuwen, S. J. C. H. %A Bielen, J. A. %A Li, Y. %A van den Heuvel, R. A. %A Gommans, J. G. %A van Rijs, F. %A Bron, P. %A Peuscher, H. J. F. %D 2006 %J Microelectronics Reliability %K dblp %N 8 %P 1279-1284 %T Wear out failure mechanisms in aluminium and gold based LDMOS RF power applications. %U http://dblp.uni-trier.de/db/journals/mr/mr46.html#WelTBLHGRBP06 %V 46

@article{journals/mr/WelTBLHGRBP06, added-at = {2007-03-27T00:00:00.000+0200}, author = {van der Wel, P. J. and Theeuwen, S. J. C. H. and Bielen, J. A. and Li, Y. and van den Heuvel, R. A. and Gommans, J. G. and van Rijs, F. and Bron, P. and Peuscher, H. J. F.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/23bd6f043cc694a4ac0a6c21a1c00875e/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2006.02.011}, interhash = {fb8cd6d150dad192e282d59bf1b17f8e}, intrahash = {3bd6f043cc694a4ac0a6c21a1c00875e}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 8, pages = {1279-1284}, timestamp = {2016-02-02T02:02:06.000+0100}, title = {Wear out failure mechanisms in aluminium and gold based LDMOS RF power applications.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#WelTBLHGRBP06}, volume = 46, year = 2006 }