%0 Journal Article %1 journals/tie/DebDPBCD20 %A Deb, Suhas %A Das, Santanu %A Pradhan, Arpan Kumar %A Banik, Apu %A Chatterjee, Biswendu %A Dalai, Sovan %D 2020 %J IEEE Trans. Ind. Electron. %K dblp %N 7 %P 5729-5736 %T Estimation of Contamination Level of Overhead Insulators Based on Surface Leakage Current Employing Detrended Fluctuation Analysis. %U http://dblp.uni-trier.de/db/journals/tie/tie67.html#DebDPBCD20 %V 67

@article{journals/tie/DebDPBCD20, added-at = {2022-02-23T00:00:00.000+0100}, author = {Deb, Suhas and Das, Santanu and Pradhan, Arpan Kumar and Banik, Apu and Chatterjee, Biswendu and Dalai, Sovan}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/212726031b1dc4466c5ae5c809b63bb77/dblp}, ee = {https://doi.org/10.1109/TIE.2019.2934008}, interhash = {da9cbf18f805a88936737a57913d62b8}, intrahash = {12726031b1dc4466c5ae5c809b63bb77}, journal = {IEEE Trans. Ind. Electron.}, keywords = {dblp}, number = 7, pages = {5729-5736}, timestamp = {2022-03-01T06:21:37.000+0100}, title = {Estimation of Contamination Level of Overhead Insulators Based on Surface Leakage Current Employing Detrended Fluctuation Analysis.}, url = {http://dblp.uni-trier.de/db/journals/tie/tie67.html#DebDPBCD20}, volume = 67, year = 2020 }