%0 Journal Article %1 journals/mr/DammannBMJ02 %A Dammann, Maximilian %A Benkhelifa, F. %A Meng, M. %A Jantz, W. %D 2002 %J Microelectronics Reliability %K dblp %N 9-11 %P 1569-1573 %T Reliability of Metamorphic HEMTs for Power Applications. %U http://dblp.uni-trier.de/db/journals/mr/mr42.html#DammannBMJ02 %V 42

@article{journals/mr/DammannBMJ02, added-at = {2019-06-30T00:00:00.000+0200}, author = {Dammann, Maximilian and Benkhelifa, F. and Meng, M. and Jantz, W.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/287b038eb59fd19dfd28f70868b7f40ee/dblp}, ee = {https://doi.org/10.1016/S0026-2714(02)00192-0}, interhash = {d53378399205ed988d32484e76589f51}, intrahash = {87b038eb59fd19dfd28f70868b7f40ee}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1569-1573}, timestamp = {2019-09-27T10:58:29.000+0200}, title = {Reliability of Metamorphic HEMTs for Power Applications.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#DammannBMJ02}, volume = 42, year = 2002 }