%0 Conference Paper %1 conf/sbcci/CorneliusSSSTS08 %A Cornelius, Claas %A Sill, Frank %A Sämrow, Hagen %A Salzmann, Jakob %A Timmermann, Dirk %A da Silva Jr., Diógenes Cecilio %B SBCCI %D 2008 %E Lubaszewski, Marcelo %E Renovell, Michel %E Gupta, Rajesh K. %I ACM %K dblp %P 111-116 %T Encountering gate oxide breakdown with shadow transistors to increase reliability. %U http://dblp.uni-trier.de/db/conf/sbcci/sbcci2008.html#CorneliusSSSTS08 %@ 978-1-60558-231-3

@inproceedings{conf/sbcci/CorneliusSSSTS08, added-at = {2018-11-06T00:00:00.000+0100}, author = {Cornelius, Claas and Sill, Frank and Sämrow, Hagen and Salzmann, Jakob and Timmermann, Dirk and da Silva Jr., Diógenes Cecilio}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2d3a549ca3f13d007fc7a8f8a72724da2/dblp}, booktitle = {SBCCI}, crossref = {conf/sbcci/2008}, editor = {Lubaszewski, Marcelo and Renovell, Michel and Gupta, Rajesh K.}, ee = {https://doi.org/10.1145/1404371.1404407}, interhash = {d51ff72e8ab0cd83093fe0acf0b6fb89}, intrahash = {d3a549ca3f13d007fc7a8f8a72724da2}, isbn = {978-1-60558-231-3}, keywords = {dblp}, pages = {111-116}, publisher = {ACM}, timestamp = {2019-09-27T20:13:19.000+0200}, title = {Encountering gate oxide breakdown with shadow transistors to increase reliability.}, url = {http://dblp.uni-trier.de/db/conf/sbcci/sbcci2008.html#CorneliusSSSTS08}, year = 2008 }