%0 Journal Article %1 journals/tcad/LiuS10 %A Liu, Qunzeng %A Sapatnekar, Sachin S. %D 2010 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 2 %P 211-222 %T Capturing Post-Silicon Variations Using a Representative Critical Path. %U http://dblp.uni-trier.de/db/journals/tcad/tcad29.html#LiuS10 %V 29

@article{journals/tcad/LiuS10, added-at = {2018-11-02T00:00:00.000+0100}, author = {Liu, Qunzeng and Sapatnekar, Sachin S.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2ab16266f8ec8b5fe044580dc6d10a229/dblp}, ee = {https://doi.org/10.1109/TCAD.2009.2035552}, interhash = {cd8c3b2af415e3f102d4a4a4c2f2c1bb}, intrahash = {ab16266f8ec8b5fe044580dc6d10a229}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 2, pages = {211-222}, timestamp = {2019-09-27T08:26:47.000+0200}, title = {Capturing Post-Silicon Variations Using a Representative Critical Path.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad29.html#LiuS10}, volume = 29, year = 2010 }